X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295.0 PEG 4000, DTT, glycerol, KPi, NaPPi, salicylate, EDTA, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 295.0K
Unit Cell:
a: 169.451 Å b: 124.493 Å c: 148.327 Å α: 90.000° β: 90.940° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.66 Solvent Content: 53.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 2.1 25 154198 7710 86.9 ? 0.2380000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 24.9 87.2 0.0950000 ? 11.9 2.8 176889 154198 0.0 -3.0 14.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 67.8 ? ? ? 2.1 5988
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C ? NSLS X8C
Software
Software Name Purpose Version
SOLVE phasing .
SHARP phasing .
EPMR phasing .
SIGMAA model building .
DM model building .
CNS refinement .
DENZO data reduction .
SCALEPACK data scaling .
SIGMAA phasing .
DM phasing .
CNS phasing .