X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.4 291 100 mM sodium cacodylate, 12% PEG 2,000 MME, 3% PEG 200, 1% cis-inositol, 20% glycerol, 1 mM rifamycin CGP 4832, pH 6.4, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 172.820 Å b: 172.820 Å c: 87.910 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 4.84 Solvent Content: 74.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 2.90 30.0 33363 1542 99.0 0.233 0.275 68.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.90 30.0 99.9 0.072 ? 17.2 4.83 ? 33363 1 1 23.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 3.08 99.8 ? ? ? 4.83 33363
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R ? ELETTRA 5.2R
Software
Software Name Purpose Version
DENZO data reduction .
XDS data reduction .
CNS refinement .
XDS data scaling .
CNS phasing .
Feedback Form
Name
Email
Institute
Feedback