X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 277 ammonium sulphate, Bis Tris propane, isopropanol, NaCl, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 117.749 Å b: 161.958 Å c: 131.599 Å α: 90.00° β: 110.36° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.0 Solvent Content: 58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.70 20.00 56944 2797 90.2 0.2000000 0.2690000 38.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.65 30 90.2 0.0480000 ? 10.3 1.76 60472 67041 -10. ? 49.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.65 2.79 92.3 ? ? 2.7 1.6 8888
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE BEAMLINE DW32 ? LURE DW32
Software
Software Name Purpose Version
AMoRE phasing .
CNS refinement .
DENZO data reduction .
CCP4 data scaling (SCALA)