X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.00 ? 50MM HEPES, 10MM MGCL2, 150MM NACL, 0.8 MM EU(NO3)3, 390MM (NH4)2SO4, 23% PEG400, pH 7.00
Unit Cell:
a: 143.330 Å b: 143.330 Å c: 60.360 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42 21 2
Crystal Properties:
Matthew's Coefficient: 3.06 Solvent Content: 66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 4.00 37.46 5448 ? 96.2 0.388 ? 50.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.000 50.000 90.3 ? 0.05900 5.9000 2.900 ? 5053 ? ? 211.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4.00 4.10 59.6 0.54100 1.500 1.90
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-2 1.7757,1.7753,1.033,0.9326 ESRF ID14-2
Software
Software Name Purpose Version
HKL data reduction .
MOSFLM data reduction V. 6.0
HKL data scaling .
SCALA data scaling .
SHARP phasing .
SOLOMON phasing .
CNS refinement 1.0