X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 277.0 PEG 1500, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 4K
Unit Cell:
a: 31.700 Å b: 42.200 Å c: 44.600 Å α: 93.20° β: 104.50° γ: 101.90°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.0 Solvent Content: 35.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.60 14.94 20600 1204 72.4 0.1870000 0.2240000 22.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 30 73 0.0710000 ? 10 3 62615 20628 0 0 19.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6 1.66 20.2 ? ? ? 2.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE BEAMLINE DW32 ? LURE DW32
Software
Software Name Purpose Version
SHARP phasing .
CNS refinement 0.9
DENZO data reduction .
SCALEPACK data scaling .