ISDA: 1CCW

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X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.6	?	pH 4.6, VAPOR DIFFUSION, HANGING DROP

Unit Cell:

a: 64.430 Å b: 113.050 Å c: 108.300 Å α: 90.00° β: 95.79° γ: 90.00°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.46 Solvent Content: 49.9

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	FREE R	1.60	30.0	?	19177	84.5	0.1369	0.1728	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.60	30.0	94.1	0.031	0.065	5.4	2.9	190420	190420	?	0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.60	1.69	94.1	?	0.173	2.7	2.5	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		105 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	EMBL/DESY, HAMBURG BEAMLINE X11	?	EMBL/DESY, HAMBURG	X11

Software

Software Name	Purpose	Version
DENZO	data reduction	.
SCALA	data scaling	.
CCP4	model building	.
SHELXL-97	refinement	.
CCP4	data scaling	(SCALA)
CCP4	phasing	.

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