1BYL

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 ? SEE REFERENCE 2, pH 6.0
Unit Cell:
a: 48.400 Å b: 48.400 Å c: 111.500 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.3 Solvent Content: 50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS ANOMALOUS DIFFERENCE OF THE NATIVE DATA SET ALLOWING TO LOCATE ALL SULFUR ATOMS 2.3 8. 5724 ? 93.0 0.1760000 ? 17.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 44.5 93.3 ? 0.669 48.4 8.3 ? 5959 ? 2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.3 2.44 58 ? 0.204 4.24 3.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE SIEMENS ? ? ?
Software
Software Name Purpose Version
LOCHVAT(SEE model building REMARK)
CCP4 model building .
PHASER phasing .
X-PLOR refinement 2.1
X-GEN data reduction .
X-GEN data scaling .
LOCHVAT phasing (SEE REMARK)
CCP4 phasing (REFINE
PHARE) phasing .