X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 ? 100 MM SODIUM ACETATE, PH 4.5, 5% PEG 8000, 0.5M NACL
Unit Cell:
a: 71.630 Å b: 71.630 Å c: 37.380 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 3
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 42
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS ? 1.5 20.0 30005 1500 83.9 ? 0.222 23.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 50.0 83.9 ? 0.034 11.6 4.2 ? 30005 ? ? 18.10
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.54 37.3 ? 0.295 0.3 2.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 ? ALS 5.0.2
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
MLPHARE phasing .
ARP model building .
DM model building .
REFMAC refinement .
CCP4 data scaling (SCALA)
ARP/wARP model building .
DM phasing .