X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 125 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
? | ? | ? | ? | ? |
Software Name | Purpose | Version |
---|---|---|
SIEMENS | data collection | XDISK |
SHELXL-93 | model building | . |
SHELXL-93 | refinement | . |
XFIT | data reduction | . |
SIEMENS | data reduction | XDISK |
SHELXL-93 | phasing | . |