X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 277 THE RC.ADE BINARY COMPLEX CRYSTALS WERE GROWN AT 4 C BY THE HANGING-DROP VAPOR DIFFUSION METHOD. THE CRYSTALLIZATION DROPLET CONTAINED PROTEIN (0.5 MM), ADENOSINE (3 MM) AND 2-METHYL-2,4-PENTANEDIOL (MPD; 4%) IN 100 MM BICINE BUFFER AT PH 8.0. THE CRYSTALLIZATION WELL SOLUTION WAS MADE UP OF 15% MPD AND 100 MM AMMONIUM-SULFATE IN BICINE BUFFER (100 MM; PH 8.0). THE CRYSTALS GREW OVER THE COURSE OF 8-12 WEEKS TO A FINAL SIZE OF 0.2 X 0.3 X 0.5 MM3., vapor diffusion - hanging drop, temperature 277K
Unit Cell:
a: 55.850 Å b: 73.230 Å c: 98.720 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.6 Solvent Content: 51.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.6 10.0 10720 ? 86.0 0.2190000 0.3400000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 30.0 86. ? 0.0940000 8.5 2.5 ? 10720 ? 0.0 45.
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.6 2.7 74. 0.2000000 1.0 1.5
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 277 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R ? ? ?
Software
Software Name Purpose Version
X-PLOR model building .
TNT refinement 5E
X-PLOR refinement .
UCSD data reduction .
UCSD data scaling .
X-PLOR phasing .