X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 ? pH 7.4
Unit Cell:
a: 87.260 Å b: 44.701 Å c: 78.778 Å α: 90.00° β: 103.45° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.33 Solvent Content: 47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MULTIPLE ISOMORPHOUS REPLACEMENT AND ANOMALOUS SCATTERING THROUGHOUT 2.2 20.0 15001 1454 98.6 0.1840000 0.2690000 15.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 20.0 98.1 0.0430000 0.0430000 12.7 3.6 ? 15089 ? 2.2 26.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.19 2.31 90.0 0.1140000 2.2 3.0
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R ? ? ?
Software
Software Name Purpose Version
SHARP phasing .
X-PLOR model building 3.84
X-PLOR refinement 3.84
DENZO data reduction .
SCALEPACK data scaling .
MOSFLM data reduction .
X-PLOR phasing 3.84