X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.3 ? COMPLEX WAS OBTAINED BY CO-CRYSTALLIZATION, 5 MICRO-L BGLA (14 MG/ML) / 5 MICRO-L 10MM LIGAND / 5 MICRO-L PP 1.3M, PH 8.3, co-crystallization
Unit Cell:
a: 205.850 Å b: 205.850 Å c: 155.500 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42 21 2
Crystal Properties:
Matthew's Coefficient: 4.2 Solvent Content: 70.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION DIFFERENCE FOURIER THROUGHOUT 2.3 8.0 107900 ? 75.6 0.2000000 0.2500000 14.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 31.4 99.4 0.0900000 0.0900000 6.2 5.7 ? 146539 ? 4. ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.36 97.2 0.3200000 2.0 3.8
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 176 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE ? LURE ?
Software
Software Name Purpose Version
X-PLOR model building 3.843
X-PLOR refinement 3.843
MOSFLM data reduction .
CCP4 data scaling (AGROVATA
ROTAVATA data scaling .
X-PLOR phasing 3.843