ISDA: 1BG9

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.7	?	pH 6.7

Unit Cell:

a: 135.200 Å b: 135.200 Å c: 79.600 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 31 2 1

Crystal Properties:

Matthew's Coefficient: 4.67 Solvent Content: 75

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	REFINEMENT DIFFERENCE FOURIER	THE VERSION OF X-PLOR (2.1) ORIGINALLY USED FOR REFINEMENT THE FREE R TEST WAS NOT AN OPTION. THEREFORE WE HAVE GIVEN THE OVERALL R FACTOR (TEST+WORKING) INSTEAD OF (WORK) TOGETHER WITH AN ESTIMATE OF THE FREE R (TEST) VALUE BASED ON A SIMULATED ANNEALING REFINEMENT WITH A NEWER VERSION OF X-PLOR (3.1).	2.8	10.0	17688	1729	86.4	0.1510000	0.2490000	20.1

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.729	?	90.5	0.0920000	0.0920000	16.6	2.9	?	17688	?	1	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.729	2.900	44.8		0.2700000	1.7	1.5

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		288 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU RUH2R	?	?	?

Software