X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 ? pH 7.5
Unit Cell:
a: 146.960 Å b: 146.960 Å c: 146.960 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 41 3 2
Crystal Properties:
Matthew's Coefficient: 3.2 Solvent Content: 62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.70 40.00 7718 825 99.7 ? 0.2340000 11.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 40.0 89.7 ? 12.7000000 4.3 2.1 ? 6085 ? ? 19.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.8 2.94 88.9 ? 33.2000000 1.4 2.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 103 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CHESS BEAMLINE F2 0.9809, 0.9795, 0.9792, 0.9770 CHESS F2
Software
Software Name Purpose Version
SOLVE phasing .
SHARP phasing .
X-PLOR refinement 3.843
MOSFLM data reduction .
CCP4 data scaling (SCALA)
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