X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 273 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU RUH2R | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| R-AXIS | data collection | II |
| R-AXIS | data reduction | II |
| PROFFT | refinement | . |
| R-AXIS | data scaling | II |
