X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 ? SITTING DROP PROCEDURE. PROTEIN DROP: 13 MG/ML PPE (SERVA) 9.3 MM SODIUM ACETATE (PH 5.0), 22.4 MM SODIUM SULFATE, 2.2 MM MDL 103,139 IN DMF RESERVOIR: 10 MM SODIUM ACETATE (PH 5.0), 20 MM SODIUM SULFATE., vapor diffusion - sitting drop
Unit Cell:
a: 69.100 Å b: 69.100 Å c: 51.100 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31
Crystal Properties:
Matthew's Coefficient: 2.7 Solvent Content: 54.71
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.8 8.0 24038 ? 95.9 0.18 ? 21.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 20.0 93.4 ? 0.5 ? 4.2 ? 24302 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 1.9 83.2 ? 0.292 ? 2.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 287 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE SIEMENS ? ? ?
Software
Software Name Purpose Version
XDS data scaling .
XSCALE data scaling .
X-PLOR model building .
X-PLOR refinement 3.1
XDS data reduction .
X-PLOR phasing .