X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.8 ? BUFFER NA/K-PHOSPHATE 20MM PH 7.8 AMMONIUM SULFATE 45% SATURATION (4 DEGREES) ACETONE 4% (V/V) PROTEIN 14.5 MG/ML
Unit Cell:
a: 42.040 Å b: 60.970 Å c: 88.910 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER DIFFERENCE METHOD, STARTING WITH 1BTL THROUGHOUT 2.0 8.0 14660 1494 93.21 0.156 0.206 28.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 38.01 93.5 0.063 0.063 ? 2.9 ? 14698 ? 1.0 26.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.25 86.24 0.144 ? 2.0
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 277 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R ? ? ?
Software
Software Name Purpose Version
PROCESS data collection (MSC)
PROCESS data reduction (MSC)
X-PLOR model building 3.1
X-PLOR refinement 3.1
PROCESS data scaling (MSC)
X-PLOR phasing 3.1