X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 293 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | SIEMENS | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| SADIE | data collection | . |
| SAINT | data reduction | . |
| X-PLOR | model building | 3.1 |
| X-PLOR | refinement | 3.1 |
| SADIE | data reduction | . |
| SAINT | data scaling | . |
| X-PLOR | phasing | 3.1 |
