X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.2 ? CRYSTALLIZED FROM 12% PEG 8000, 50MM MOPS, PH 7.2, BATCH METHOD SOAKED IN 2MM PHENOL, batch method
Unit Cell:
a: 52.120 Å b: 65.080 Å c: 76.300 Å α: 100.20° β: 111.44° γ: 105.81°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.06 Solvent Content: 59.5
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ISOMORPHOUS TO NATIVE FREE R 2.50 24.97 28131 1969 95.8 ? 0.2168 40.61
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.50 24.97 95.8 0.42 ? 13.1 2.0 ? 28131 ? ? 17.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.63 93.9 ? ? 6.5 1.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 300 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU ? ? ?
Software
Software Name Purpose Version
REFMAC refinement .
MOSFLM data reduction .
CCP4 data scaling (AGROVATA
ROTAVATA data scaling .