X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 ? pH 7.0
Unit Cell:
a: 37.760 Å b: 43.710 Å c: 107.440 Å α: 90.00° β: 108.54° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.99 Solvent Content: 38.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.3 8.0 12564 ? 85.7 0.1680000 ? ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50.9 84.7 0.0820000 ? ? 3.2 ? 12942 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 300 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
? BRUKER NONIUS ? ? ?
Software
Software Name Purpose Version
X-PLOR model building 3.1
X-PLOR refinement 3.1
HANEEF refinement .
HARRIS refinement .
HOWLIN refinement .
KHAN refinement .
MADNES data reduction .
PRECURSOR data scaling TO ABSURD/ ROTAVATA/AGROVATA
X-PLOR phasing 3.1