X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 CRYSTALS WERE OBTAINED AT 277 K BY THE HANGING-DROP VAPOR DIFFUSION METHOD FROM SOLUTIONS CONTAINING 10 MG/ML(PROTEIN,GTPGAMMAS,MG2+ MIXTURE), 10% PEG 8000,7.5% 14-DIOXANE, 50 MM TRIS-HCL PH 8.5, EQUILIBRATED AGAINST 20% PEG 8000,15% 14-DIOXANE, 100 MM TRIS-HCL PH 8.5, vapor diffusion - hanging drop
Unit Cell:
a: 62.020 Å b: 74.780 Å c: 50.520 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.77 Solvent Content: 56.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4 15. 8382 893 86.7 0.195 0.268 43.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 ? 89.3 0.0875 ? 7.91 ? ? 8683 ? 1. 31.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.5 74.8 ? 2.04 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 283 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R ? ? ?
Software
Software Name Purpose Version
PROCESS data collection .
PROCESS data reduction .
X-PLOR model building 3.8
X-PLOR refinement 3.8
PROCESS data scaling .
X-PLOR phasing 3.8