X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 ? 23% PEG 4000 (W/V), 0.10 M SODIUM CITRATE, AND 0.2 M AMMONIUM ACETATE (PH 5.6). CRYSTALS (0.2 X 0.2 X 0.5 MM) WERE OBTAINED IN 4-6 WEEKS.
Unit Cell:
a: 66.560 Å b: 65.570 Å c: 103.220 Å α: 90.00° β: 97.04° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.37 Solvent Content: 48.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT A POSTERIORI 1.90 20.00 58785 1143 84.4 0.221 0.271 16.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 ? 84. 0.085 0.071 6. 3.8 ? 63078 ? 0. 11.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 2.0 82. ? 0.27 1.6 2.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 125 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R ? ? ?
Software
Software Name Purpose Version
UCSD data collection DATA PROCESSING SOFTWARE
UCSD data reduction DATA PROCESSING SOFTWARE
X-PLOR model building 3.851
X-PLOR refinement 3.851
UCSD data scaling .
X-PLOR phasing 3.851