X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 293 PEG 300, pH 4.2, vapor diffusion, sitting drop, temperature 293K, VAPOR DIFFUSION, SITTING DROP
Unit Cell:
a: 48.638 Å b: 48.638 Å c: 206.011 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 2 2
Crystal Properties:
Matthew's Coefficient: 2.05 Solvent Content: 39.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS ? 1.8000 39.6910 ? 2195 99.7800 0.1683 0.1954 32.6815
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.798 39.691 99.400 ? 0.061 22.700 11.700 23815 23815 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.800 1.900 96.400 ? 0.495 1.600 10.700 3251
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 1.0 SSRL BL9-2
Software
Software Name Purpose Version
SCALA data scaling 3.3.16
SOLVE phasing 2.13
RESOLVE phasing 2.15
PHENIX refinement 1.6_288
PDB_EXTRACT data extraction 3.10